X-Ray Substructure Analysis in Galvanic Copper Coatings Deposited at Different Bath Temperatures
p.879
p.879
X-Ray Analysis of Textures in Galvanic Copper Coatings Deposited at Different Temperatures
p.885
p.885
X-Ray Diffraction Characterisation of Polysilicon Layers
p.891
p.891
X-Ray Diffraction Studies of the Phase Formation in thin In/Ni Films
p.897
p.897
XRD-Investigations of Phase-Formation in High Dose Fe- and Co-Ion Co-implanted Si (100) Wafers
p.903
p.903
XRD on Polycrystalline Diamond Films obtained by CVD Technique
p.907
p.907
X-Ray Diffraction Examination of Structure and Stability of Amorphous Cu-W Thin Films
p.913
p.913
Grain-Size Determination by means of X-Ray and Neutron High-Angle Diffraction
p.921
p.921
Changes of Lattice Parameters in Small Particles of Hexagonal Crystals
p.927
p.927
XRD-Investigations of Phase-Formation in High Dose Fe- and Co-Ion Co-implanted Si (100) Wafers
Abstract:
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Periodical:
Materials Science Forum (Volumes 133-136)
Pages:
903-906
Citation:
Online since:
January 1993
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© 1993 Trans Tech Publications Ltd. All Rights Reserved
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