On the Texturing in YBa2Cu3O7-x Bulk Sample Prepared by melted Stage Crystallization
p.859
p.859
X-Ray Investigations of Platinum Layers on Dense Construction Ceramics with Regard to Residual Stresses and Stress-free Lattice Constants
p.867
p.867
Internal Stress Tensor Determination in Molybdenum and Molybdenum-Carbon Thin Films Deposited by D.C. Magnetron Sputtering
p.873
p.873
X-Ray Substructure Analysis in Galvanic Copper Coatings Deposited at Different Bath Temperatures
p.879
p.879
X-Ray Analysis of Textures in Galvanic Copper Coatings Deposited at Different Temperatures
p.885
p.885
X-Ray Diffraction Characterisation of Polysilicon Layers
p.891
p.891
X-Ray Diffraction Studies of the Phase Formation in thin In/Ni Films
p.897
p.897
XRD-Investigations of Phase-Formation in High Dose Fe- and Co-Ion Co-implanted Si (100) Wafers
p.903
p.903
XRD on Polycrystalline Diamond Films obtained by CVD Technique
p.907
p.907
X-Ray Analysis of Textures in Galvanic Copper Coatings Deposited at Different Temperatures
Abstract:
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Periodical:
Materials Science Forum (Volumes 133-136)
Pages:
885-890
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Online since:
January 1993
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© 1993 Trans Tech Publications Ltd. All Rights Reserved
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