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Materials Science Forum
Vols. 133-136
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Materials Science Forum Vols. 133-136

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.133-136

ToC:

Table of Contents

Paper Title Page

Diffraction from Thin Layers
Authors: P.F. Fewster, N.L. Andrew
221
Glancing-Incidence X-Ray Analysis of Thin Films
Authors: D.K.G. De Boer, W.W. van den Hoogenhof
231
Intermediate-Resolution Reciprocal-Space Mapper
Authors: P. Van der Sluis
237
Locally Resolved X-Ray Investigations by Means of X-Ray Optics
Authors: A. Krutzenbichler, J. Keimel, G. Fritsch
243
A New Apparatus for In-Situ X-Ray Diffraction
Authors: D.R. Bates, G.D. Squire, D.C. Puxley
249
In Situ Study of Particle Growth
Authors: L. Grabaek, B.S. Clausen, G. Steffensen, H. Topsoe
255
A High Pressure Study of Metallic Glasses using Energy-Dispersive Powder Diffraction
Authors: S.M. Clark, G. Oszlányi
261
X-Ray Diffractometry at High Temperatures
Authors: M. Ermrich
267
On the use of CPS120 Data in Rietveld Analysis
Authors: Kenny Ståhl
273
An Unconventional Pile-up Correction
Authors: J. Bergmann, L. Hollang, K. Richter
279

Showing 31 to 40 of 151 Paper Titles

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