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HomeMaterials Science ForumMaterials Science Forum Vols. 143-147Electron and Hole Traps in AlAs p+-n Junctions...

Electron and Hole Traps in AlAs p⁺-n Junctions Grown by MBE

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Defects in Semiconductors 17

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Periodical:

Materials Science Forum (Volumes 143-147)

Pages:

359-364

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.143-147.359

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Online since:

October 1993

Authors:

P. Krispin, R. Hey

Keywords:

AlAs, Electron Trap, Hole Traps, Intrinsic Defect

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© 1994 Trans Tech Publications Ltd. All Rights Reserved

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