Characterization of Semiconductor Surfaces and Interfaces by X-Ray Reflectivity Measurements

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Periodical:

Materials Science Forum (Volumes 143-147)

Edited by:

Helmut Heinrich and Wolfgang Jantsch

Pages:

561-566

DOI:

10.4028/www.scientific.net/MSF.143-147.561

Citation:

W. Plotz et al., "Characterization of Semiconductor Surfaces and Interfaces by X-Ray Reflectivity Measurements", Materials Science Forum, Vols. 143-147, pp. 561-566, 1994

Online since:

October 1993

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$35.00

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