X-Ray Method for Continuous Tracking of Grain Boundary Motion: Investigation of Grain Boundary Migration in Al-Bicrystals

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Periodical:

Materials Science Forum (Volumes 157-162)

Edited by:

H.J. Bunge

Pages:

125-130

DOI:

10.4028/www.scientific.net/MSF.157-162.125

Citation:

U. Czubayko et al., "X-Ray Method for Continuous Tracking of Grain Boundary Motion: Investigation of Grain Boundary Migration in Al-Bicrystals ", Materials Science Forum, Vols. 157-162, pp. 125-130, 1994

Online since:

May 1994

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$35.00

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