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HomeMaterials Science ForumMaterials Science Forum Vols. 157-162X-Ray Method for Continuous Tracking of Grain...

X-Ray Method for Continuous Tracking of Grain Boundary Motion: Investigation of Grain Boundary Migration in Al-Bicrystals

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Textures of Materials - ICOTOM 10

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Periodical:

Materials Science Forum (Volumes 157-162)

Pages:

125-130

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.157-162.125

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Online since:

May 1994

Authors:

U. Czubayko, Dmitri A. Molodov, B.-C. Petersen, Günter Gottstein, Lasar S. Shvindlerman

Keywords:

Activation, Aluminum (Al), Grain Bondary Migration, Grain Boundary Measurement, Mobility

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© 1994 Trans Tech Publications Ltd. All Rights Reserved

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