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HomeMaterials Science ForumMaterials Science Forum Vols. 157-162Automatic Recognition of Deformed and...

Automatic Recognition of Deformed and Recrystallized Regions in Partly Recrystallized Samples Using Electron Back Scattering Patterns

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Periodical:

Materials Science Forum (Volumes 157-162)

Pages:

149-158

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.157-162.149

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Online since:

May 1994

Authors:

N.C. Krieger Lassen, Dorte Juul Jensen, K. Condradsen

Keywords:

Automation, Classification, Electron Back Scattering Patterns, Fourier Transform, Growth Rate, Image Processing, Recrystallization

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© 1994 Trans Tech Publications Ltd. All Rights Reserved

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