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HomeMaterials Science ForumMaterials Science Forum Vols. 157-162Optimization of the Texture Determination of Thin...

Optimization of the Texture Determination of Thin Films from X-Ray Diffraction Measurements

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Textures of Materials - ICOTOM 10

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Periodical:

Materials Science Forum (Volumes 157-162)

Pages:

159-166

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.157-162.159

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Online since:

May 1994

Authors:

B. Moreau, Francis Wagner, H. Göbel

Keywords:

Reduced Incindence, Texture Analysis, X-Ray Diffraction (XRD)

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© 1994 Trans Tech Publications Ltd. All Rights Reserved

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