Optimization of the Texture Determination of Thin Films from X-Ray Diffraction Measurements

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Periodical:

Materials Science Forum (Volumes 157-162)

Edited by:

H.J. Bunge

Pages:

159-166

DOI:

10.4028/www.scientific.net/MSF.157-162.159

Citation:

B. Moreau et al., "Optimization of the Texture Determination of Thin Films from X-Ray Diffraction Measurements ", Materials Science Forum, Vols. 157-162, pp. 159-166, 1994

Online since:

May 1994

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$35.00

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