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An Experimental Apparatus for Quantitative On-Line Texture Analysis
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Investigation of Inhomogeneous Textures of Coatings and Near-Surface-Layers
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A New Method for Texture Measurement Based on an X-Ray Imaging Plate System
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X-Ray Method for Continuous Tracking of Grain Boundary Motion: Investigation of Grain Boundary Migration in Al-Bicrystals
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A High-Pressure Device for In-Situ Measurements in a Neutron Beam
p.131

Electronmicrodiffraction (EBSP) in the Scanning Electron Microscope (SEM): Further Hardware Development to Improve Pattern Quality
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A High Resolution Electron Diffraction Method for On-Line Texture Analysis
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Automatic Recognition of Deformed and Recrystallized Regions in Partly Recrystallized Samples Using Electron Back Scattering Patterns
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Optimization of the Texture Determination of Thin Films from X-Ray Diffraction Measurements
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HomeMaterials Science ForumMaterials Science Forum Vols. 157-162A High-Pressure Device for In-Situ Measurements in...

A High-Pressure Device for In-Situ Measurements in a Neutron Beam

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Textures of Materials - ICOTOM 10

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Periodical:

Materials Science Forum (Volumes 157-162)

Pages:

131-136

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.157-162.131

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Online since:

May 1994

Authors:

J. Heinitz, N.N. Isakov, A.N. Nikitin, W.A. Sukhoparov, K. Ullemeyer, Kurt Walther

Keywords:

Deformation Experiments, High Pressure Device, Neutron Investigations, Texture Transformations

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© 1994 Trans Tech Publications Ltd. All Rights Reserved

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