Investigation of Inhomogeneous Textures of Coatings and Near-Surface-Layers
p.111
p.111
A New Method for Texture Measurement Based on an X-Ray Imaging Plate System
p.119
p.119
X-Ray Method for Continuous Tracking of Grain Boundary Motion: Investigation of Grain Boundary Migration in Al-Bicrystals
p.125
p.125
A High-Pressure Device for In-Situ Measurements in a Neutron Beam
p.131
p.131
Electronmicrodiffraction (EBSP) in the Scanning Electron Microscope (SEM): Further Hardware Development to Improve Pattern Quality
p.137
p.137
A High Resolution Electron Diffraction Method for On-Line Texture Analysis
p.143
p.143
Automatic Recognition of Deformed and Recrystallized Regions in Partly Recrystallized Samples Using Electron Back Scattering Patterns
p.149
p.149
Optimization of the Texture Determination of Thin Films from X-Ray Diffraction Measurements
p.159
p.159
Determination of Texture in CuZnAl Shape Memory Alloys in the High Temperature Austenitic Phase
p.167
p.167
Electronmicrodiffraction (EBSP) in the Scanning Electron Microscope (SEM): Further Hardware Development to Improve Pattern Quality
Abstract:
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Periodical:
Materials Science Forum (Volumes 157-162)
Pages:
137-142
Citation:
Online since:
May 1994
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© 1994 Trans Tech Publications Ltd. All Rights Reserved
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