Electronmicrodiffraction (EBSP) in the Scanning Electron Microscope (SEM): Further Hardware Development to Improve Pattern Quality

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Periodical:

Materials Science Forum (Volumes 157-162)

Edited by:

H.J. Bunge

Pages:

137-142

DOI:

10.4028/www.scientific.net/MSF.157-162.137

Citation:

J. Hjelen et al., "Electronmicrodiffraction (EBSP) in the Scanning Electron Microscope (SEM): Further Hardware Development to Improve Pattern Quality ", Materials Science Forum, Vols. 157-162, pp. 137-142, 1994

Online since:

May 1994

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$35.00

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