Paper Titles

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Orientation Connectivity in Polycrystals
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High Temperature Texture Goniometer for the Measurement of Transformation Textures
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A CCD Camera System for the Acquisition of Backscatter Kikuchi Patterns on an SEM
p.187

An Inexpensive CCD Camera System for the Recording and On-Line Interpretation of TEM Kikuchi Patterns
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On-Line Interpretation of SAD Channeling Patterns
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Preparation of High-Resistance or Sensitive Samples for Grain Orientation Measurement with Electron Microscopes
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Equipment for Texture Measurement in Thin Films
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HomeMaterials Science ForumMaterials Science Forum Vols. 157-162A CCD Camera System for the Acquisition of...

A CCD Camera System for the Acquisition of Backscatter Kikuchi Patterns on an SEM

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Textures of Materials - ICOTOM 10

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Periodical:

Materials Science Forum (Volumes 157-162)

Pages:

187-188

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.157-162.187

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Online since:

May 1994

Authors:

Robert A. Schwarzer

Keywords:

Backscatter Kikuchi Patterns, CCD Camera, Electron Diffraction (ED), Scanning Electron Microscope (SEM)

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© 1994 Trans Tech Publications Ltd. All Rights Reserved

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