Preparation of High-Resistance or Sensitive Samples for Grain Orientation Measurement with Electron Microscopes

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Periodical:

Materials Science Forum (Volumes 157-162)

Edited by:

H.J. Bunge

Pages:

201-206

DOI:

10.4028/www.scientific.net/MSF.157-162.201

Citation:

R. A. Schwarzer "Preparation of High-Resistance or Sensitive Samples for Grain Orientation Measurement with Electron Microscopes ", Materials Science Forum, Vols. 157-162, pp. 201-206, 1994

Online since:

May 1994

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$35.00

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