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Preparation of High-Resistance or Sensitive Samples for Grain Orientation Measurement with Electron Microscopes
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HomeMaterials Science ForumMaterials Science Forum Vols. 157-162Preparation of High-Resistance or Sensitive...

Preparation of High-Resistance or Sensitive Samples for Grain Orientation Measurement with Electron Microscopes

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Textures of Materials - ICOTOM 10

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Periodical:

Materials Science Forum (Volumes 157-162)

Pages:

201-206

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.157-162.201

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Online since:

May 1994

Authors:

Robert A. Schwarzer

Keywords:

Ceramic, Electron Diffraction (ED), Gas Discharge, Insulator, Kikuchi Patterns, Sample Preparation, Scanning Electron Microscope (SEM), TEM

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© 1994 Trans Tech Publications Ltd. All Rights Reserved

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