Equipment for Texture Measurement in Thin Films

Abstract:

Article Preview

Info:

Periodical:

Materials Science Forum (Volumes 157-162)

Edited by:

H.J. Bunge

Pages:

207-212

DOI:

10.4028/www.scientific.net/MSF.157-162.207

Citation:

J. A. Szpunar and P. Blandford, "Equipment for Texture Measurement in Thin Films ", Materials Science Forum, Vols. 157-162, pp. 207-212, 1994

Online since:

May 1994

Keywords:

Export:

Price:

$35.00

In order to see related information, you need to Login.