Paper Titles

Preparation of High-Resistance or Sensitive Samples for Grain Orientation Measurement with Electron Microscopes
p.201

Equipment for Texture Measurement in Thin Films
p.207

Application of the Method for Non-Destructive Evaluation of Texture Heterogeneity
p.213

Influence of Texture on Backscattered Ultrasonic Noise
p.221

Characterisation of Multilayers Crystallographic Texture
p.227

Determination of the Texture of a TiNi Shape Memory Alloy by Treatment of a Set of Overlapping Rays
p.235

On-Line Determination of Deformation Systems for Cubic and Hexagonal Materials with the TEM
p.241

On-line Interpretation of Spot and Kikuchi Patterns
p.247

Determination of Magnetic Textures in Ferromagnetics by Means of Neutron Diffraction
p.251

HomeMaterials Science ForumMaterials Science Forum Vols. 157-162Characterisation of Multilayers Crystallographic...

Characterisation of Multilayers Crystallographic Texture

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Textures of Materials - ICOTOM 10

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Periodical:

Materials Science Forum (Volumes 157-162)

Pages:

227-234

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.157-162.227

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Online since:

May 1994

Authors:

A. Tizliouine, J. Bessières, J.J. Heizmann, J.F. Bobo

Keywords:

Aluminium-Iron Epitaxy, Diffraction, Kiessig Fringes, Low Incidence Geometry, Multilayer

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© 1994 Trans Tech Publications Ltd. All Rights Reserved

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