Paper Titles

Laser Deposited Phthalocyanine- and Fullerene-Based Photovoltaic Cells
p.117

Synthesis of ß-FeSi₂-Films by Pulsed Laser Deposition
p.123

Complex Semiconductor Compound Targets for Pulsed Laser Deposition
p.129

Pulsed Laser Deposition and Characterization of CuInSe₂ Thin Films for Solar Cell Applications
p.135

Laser Characterization of Semiconductors
p.141

Silicon Surface Nonlinear Optics
p.153

Mapping of Defect-Related Silicon Properties with the ELYMAT Technique in Three Dimensions
p.159

Laser Examined AlGaAs-Solar Cells with Wide-Gap Tunneling-Thin Cap Layers
p.165

Use of Photoinduced Microwave Reflection for the Non-Destructive Characterization of Solar Cell Materials and Device Structures
p.171

HomeMaterials Science ForumMaterials Science Forum Vols. 173-174Laser Characterization of Semiconductors

Laser Characterization of Semiconductors

Article Preview

Abstract:

You might also be interested in these eBooks

Semiconductor Processing and Characterization with Lasers

Info:

Periodical:

Materials Science Forum (Volumes 173-174)

Pages:

141-152

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.173-174.141

Citation:

Cite this paper

Online since:

September 1994

Authors:

M. Stutzmann

Keywords:

CulnSe₂, FeSi₂, GaAs, Holographic Recrystallization, Laser, LBIC, Moving Grating, Photocarrier Grating, Photoinduced Absorption, Photothermal Deflection, Raman Scattering, Si-Ge Alloys, Silicon, Time-of-Flight (TOF)

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

© 1995 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation: