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Mapping of Defect-Related Silicon Properties with the ELYMAT Technique in Three Dimensions
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Laser Examined AlGaAs-Solar Cells with Wide-Gap Tunneling-Thin Cap Layers
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Use of Photoinduced Microwave Reflection for the Non-Destructive Characterization of Solar Cell Materials and Device Structures
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Photothermal Deflection Spectroscopy on Amorphous Semiconductor Heterojunctions and Determination of the Interface Defect Densities
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Summary Abstract: Laser Surface Photovoltage Spectroscopy - A New Tool for Determination of Surface State Distributions and Properties
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Photorefractive Two Wave Mixing and Steady State Photocarrier Gratings for Semiconductor Characterization
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A Novel Contactless Approach for Accurate Measurements of Electron-Hole Recombination Lifetime
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HomeMaterials Science ForumMaterials Science Forum Vols. 173-174Use of Photoinduced Microwave Reflection for the...

Use of Photoinduced Microwave Reflection for the Non-Destructive Characterization of Solar Cell Materials and Device Structures

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Periodical:

Materials Science Forum (Volumes 173-174)

Pages:

171-176

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.173-174.171

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Online since:

September 1994

Authors:

J.M. Borrego

Keywords:

Lifetime, Micro-Wave, Non-Destructive, Surface Recombination Velocity

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© 1995 Trans Tech Publications Ltd. All Rights Reserved

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