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HomeMaterials Science ForumMaterials Science Forum Vols. 173-174A Novel Contactless Approach for Accurate...

A Novel Contactless Approach for Accurate Measurements of Electron-Hole Recombination Lifetime

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Semiconductor Processing and Characterization with Lasers

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Periodical:

Materials Science Forum (Volumes 173-174)

Pages:

191-196

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.173-174.191

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Online since:

September 1994

Authors:

G. Breglio, Antonello Cutolo, P. Spirito, L. Zeni

Keywords:

Contactless Diagnostics, Optical Characterization, Semiconductor

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© 1995 Trans Tech Publications Ltd. All Rights Reserved

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