Paper Titles

Silicon Surface Nonlinear Optics
p.153

Mapping of Defect-Related Silicon Properties with the ELYMAT Technique in Three Dimensions
p.159

Laser Examined AlGaAs-Solar Cells with Wide-Gap Tunneling-Thin Cap Layers
p.165

Use of Photoinduced Microwave Reflection for the Non-Destructive Characterization of Solar Cell Materials and Device Structures
p.171

Photothermal Deflection Spectroscopy on Amorphous Semiconductor Heterojunctions and Determination of the Interface Defect Densities
p.177

Summary Abstract: Laser Surface Photovoltage Spectroscopy - A New Tool for Determination of Surface State Distributions and Properties
p.183

Photorefractive Two Wave Mixing and Steady State Photocarrier Gratings for Semiconductor Characterization
p.185

A Novel Contactless Approach for Accurate Measurements of Electron-Hole Recombination Lifetime
p.191

Raman Studies of Doped Poly-Si Thin Films Prepared by Pulsed Excimer Laser Annealing
p.197

HomeMaterials Science ForumMaterials Science Forum Vols. 173-174Photothermal Deflection Spectroscopy on Amorphous...

Photothermal Deflection Spectroscopy on Amorphous Semiconductor Heterojunctions and Determination of the Interface Defect Densities

Article Preview

Abstract:

You might also be interested in these eBooks

Semiconductor Processing and Characterization with Lasers

Info:

Periodical:

Materials Science Forum (Volumes 173-174)

Pages:

177-182

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.173-174.177

Citation:

Cite this paper

Online since:

September 1994

Authors:

F. Becker, Reinhard Carius, J.-Th. Zettler, J. Klomfass, C. Walker, H. Wagner

Keywords:

Amorphous Semiconductor, Defect Density, Heterojunction, Photothermal Deflection Spectroscopy

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

© 1995 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation: