Oscillator Strengths and Linewidths of Shallow Impurity Spectra in Si and Ge

Abstract:

Article Preview

Info:

Periodical:

Materials Science Forum (Volumes 196-201)

Edited by:

M. Suezawa and H. Katayama-Yoshida

Pages:

121-126

DOI:

10.4028/www.scientific.net/MSF.196-201.121

Citation:

B. A. Andreev et al., "Oscillator Strengths and Linewidths of Shallow Impurity Spectra in Si and Ge", Materials Science Forum, Vols. 196-201, pp. 121-126, 1995

Online since:

November 1995

Export:

Price:

$35.00

In order to see related information, you need to Login.