Oscillator Strengths and Linewidths of Shallow Impurity Spectra in Si and Ge

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Periodical:

Materials Science Forum (Volumes 196-201)

Edited by:

M. Suezawa and H. Katayama-Yoshida

Pages:

121-126

Citation:

B. A. Andreev et al., "Oscillator Strengths and Linewidths of Shallow Impurity Spectra in Si and Ge", Materials Science Forum, Vols. 196-201, pp. 121-126, 1995

Online since:

November 1995

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