Profiling the Deep Levels inSiGe/Si Microstructure by Small-Pulse Deep Level Transient Spectroscopy

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Periodical:

Materials Science Forum (Volumes 196-201)

Edited by:

M. Suezawa and H. Katayama-Yoshida

Pages:

485-490

DOI:

10.4028/www.scientific.net/MSF.196-201.485

Citation:

R. Zhang et al., "Profiling the Deep Levels inSiGe/Si Microstructure by Small-Pulse Deep Level Transient Spectroscopy", Materials Science Forum, Vols. 196-201, pp. 485-490, 1995

Online since:

November 1995

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$35.00

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