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HomeMaterials Science ForumMaterials Science Forum Vols. 207-209XPS Study of Ni Layers Deposited on 6H-SiC

XPS Study of Ni Layers Deposited on 6H-SiC

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Intergranular and Interphase Boundaries in Materials II

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Periodical:

Materials Science Forum (Volumes 207-209)

Pages:

293-296

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.207-209.293

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Online since:

February 1996

Authors:

Ts. Marinova, V. Krastev, Christer Hallin, Rositza Yakimova, Erik Janzén

Keywords:

Electrical Properties, Layer, Nickel Ni, Ohmic Contact, Silicon Carbide (SiC), X-Ray Photoelectron Spectroscopy (XPS)

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© 1996 Trans Tech Publications Ltd. All Rights Reserved

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