Buried SiO2 Films: Interfaces and Defects

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Periodical:

Materials Science Forum (Volumes 239-241)

Edited by:

G.E. Matthews and R.T. Williams

Pages:

1-6

DOI:

10.4028/www.scientific.net/MSF.239-241.1

Citation:

A. Stesmans "Buried SiO2 Films: Interfaces and Defects", Materials Science Forum, Vols. 239-241, pp. 1-6, 1997

Online since:

January 1997

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