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Paper Titles
Foreword
Buried SiO2 Films: Interfaces and Defects
p.1
Generation and Annealing Kinetics of Oxygen Vacancy and Oxygen Excess Centers in Thin Film SiO2
p.7
Theoretical Exploration of 29Si Hyperfine and Superhyperfine Parameters of E' Centers as a Measure of Range-II Order in a-SiO2
p.11
Further Study of the Distribution of the Tunneling States in Neutron Irradiated Quartz
p.15
Visible/Infra-Red Absorption Study in Fiber Geometry of Metastable Defect States in High-Purity Fused Silicas
p.19
Laser-Induced Luminescence in Glassy SiO2 and Neutron-Irradiated Alpha-Quartz: Three Types of Non-Bridging Oxygen Hole Centers
p.25
Defects in Quartz Related to Li Ions
p.29
Theory of Impurity Interactions in Silicon Dioxide
p.33

Theoretical Exploration of 29Si Hyperfine and Superhyperfine Parameters of E' Centers as a Measure of Range-II Order in a-SiO2

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Periodical:

Materials Science Forum (Volumes 239-241)

Pages:

11-14

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.239-241.11

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Online since:

January 1997

Authors:

Arthur H. Edwards, W. Beall Fowler, T.S. Elicker

Keywords:

Hyperfine Interaction, Point Defect, SiO2, Theory

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© 1997 Trans Tech Publications Ltd. All Rights Reserved

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