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HomeMaterials Science ForumMaterials Science Forum Vols. 255-257Combination of Positron Annihilation and Scanning...

Combination of Positron Annihilation and Scanning Tunneling Microscopy: A Unique Approach to Characterize Defects

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Periodical:

Materials Science Forum (Volumes 255-257)

Pages:

494-496

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.255-257.494

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Online since:

September 1997

Authors:

J. Gebauer, Reinhard Krause-Rehberg, C. Domke, Ph. Ebert, K. Urban

Keywords:

GaAs, Positron Annihilation, Scanning Tunneling Microscopy, Si_As Acceptors, Si_Ga-V_Ga Complexes

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© 1997 Trans Tech Publications Ltd. All Rights Reserved

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