Combination of Positron Annihilation and Scanning Tunneling Microscopy: A Unique Approach to Characterize Defects

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Periodical:

Materials Science Forum (Volumes 255-257)

Edited by:

Y. C. Jean, Morten Eldrup, David M. Schrader, Roy N. West

Pages:

494-496

Citation:

J. Gebauer et al., "Combination of Positron Annihilation and Scanning Tunneling Microscopy: A Unique Approach to Characterize Defects", Materials Science Forum, Vols. 255-257, pp. 494-496, 1997

Online since:

September 1997

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$38.00

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