Characterization of Grain Boundaries of Al-doped Sintered β-SiC by Both HRTEM and STEM

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Periodical:

Materials Science Forum (Volumes 294-296)

Edited by:

Pavel Lejcek and Václav Paidar

Pages:

269-272

DOI:

10.4028/www.scientific.net/MSF.294-296.269

Citation:

K. Kaneko et al., "Characterization of Grain Boundaries of Al-doped Sintered β-SiC by Both HRTEM and STEM", Materials Science Forum, Vols. 294-296, pp. 269-272, 1999

Online since:

November 1998

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$35.00

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