Paper Titles

Texture Organisation in Deposited Cu - Layers
p.411

Application of the Monte Carlo Method to Fiber Texture of Electrolytically Deposited Ni Films
p.417

Structure and Composition of Aluminised Layers and RF-Sputtered Alumina Coatings on High Chromium Martensitic Steel
p.422

Analysis of the State of Stress in Precipitating Alloy Films. Precipitation of Ti in Mo-Ti Films
p.428

GIXR and GIXRD Investigations of ITO Films during Post-Deposition Annealing
p.434

Strain-Texture Correlation in r.f. Magnetron Sputtered Thin Films
p.439

X-Ray Characterization of LPOMVPE Grown AlAs/GaAs Multilayer
p.445

Characterization of Ni₈₀Fe₂₀/Cu Multilayers by X-Ray Reflection Using Anomalous Scattering
p.451

Investigation of SiGe/Si - Heterostructures with High Resolution X-Ray Diffraction Methods
p.457

HomeMaterials Science ForumMaterials Science Forum Vols. 321-324GIXR and GIXRD Investigations of ITO Films during...

GIXR and GIXRD Investigations of ITO Films during Post-Deposition Annealing

Article Preview

Abstract:

You might also be interested in these eBooks

$European Powder Diffraction 6$ View Preview

Info:

Periodical:

Materials Science Forum (Volumes 321-324)

Pages:

434-438

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.321-324.434

Citation:

Cite this paper

Online since:

January 2000

Authors:

M. Quaas, H. Steffen, Harm Wulff

Keywords:

ITO Film, Reflectometry, Temperature Resolved Grazing Incidence X-Ray Diffractometry, Time Resolved Grazing Incidence X-Ray Diffractometry

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

© 2000 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation: