Paper Titles

Analysis of the State of Stress in Precipitating Alloy Films. Precipitation of Ti in Mo-Ti Films
p.428

GIXR and GIXRD Investigations of ITO Films during Post-Deposition Annealing
p.434

Strain-Texture Correlation in r.f. Magnetron Sputtered Thin Films
p.439

X-Ray Characterization of LPOMVPE Grown AlAs/GaAs Multilayer
p.445

Characterization of Ni₈₀Fe₂₀/Cu Multilayers by X-Ray Reflection Using Anomalous Scattering
p.451

Investigation of SiGe/Si - Heterostructures with High Resolution X-Ray Diffraction Methods
p.457

XRD Study Thermal Stability of Mo/V Crystalline Multilayers
p.463

Neutron Scattering Study of Polymer Membrane Based on Interpenetrating Network
p.470

Interface Characterization of Immiscible Polymer Blends by Means of XR and NR Investigations
p.475

HomeMaterials Science ForumMaterials Science Forum Vols. 321-324Characterization of Ni80Fe20/Cu Multilayers by...

Characterization of Ni₈₀Fe₂₀/Cu Multilayers by X-Ray Reflection Using Anomalous Scattering

Article Preview

Abstract:

You might also be interested in these eBooks

$European Powder Diffraction 6$ View Preview

Info:

Periodical:

Materials Science Forum (Volumes 321-324)

Pages:

451-456

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.321-324.451

Citation:

Cite this paper

Online since:

January 2000

Authors:

D.C. Meyer, K. Richter, B. Wehner, G. Reiss, L. van Loyen, P. Paufler

Keywords:

Anomalous Scattering, Fluorescence EXAFS, Multilayer, X-Ray Reflectometry

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

© 2000 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation: