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Characterization of Radiation- Induced Defects in ZnO Probed by Positron Annihilation Spectroscopy
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Defect Studies in BaTiO₃ Ceramics Using Positron Annihilation Spectroscopy
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Positron Study of Cu-Se, In-Se and CuInSe₂ Thin Films
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A Study of Vacancy-Like Defects in the Chalcopyrite Semiconductor AgInSe₂
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A Positron Annihilation Study of Compensation Defects Responsible for Conduction- Type Conversions in LEC-Grown InP
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HomeMaterials Science ForumMaterials Science Forum Vols. 363-365Positron Study of Cu-Se, In-Se and CuInSe2 Thin...

Positron Study of Cu-Se, In-Se and CuInSe₂ Thin Films

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Periodical:

Materials Science Forum (Volumes 363-365)

Pages:

147-149

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.363-365.147

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Online since:

April 2001

Authors:

N. Nancheva, P. Docheva, Nikolay Djourelov, M. Balcheva

Keywords:

CIS Films, DC Magnetron Sputtering, Positron Annihilation, Vacancy, Vacancy Cluster, X-Ray Diffraction (XRD)

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© 2001 Trans Tech Publications Ltd. All Rights Reserved

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