Amorphous-to-Crystalline Transformation of Thin ITO Films Studied by In-Situ Grazing Incidence X-Ray Diffractometry

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Periodical:

Materials Science Forum (Volumes 378-381)

Edited by:

R. Delhez and E.J. Mittemeijer

Pages:

320-325

DOI:

10.4028/www.scientific.net/MSF.378-381.320

Citation:

M. Quaas et al., "Amorphous-to-Crystalline Transformation of Thin ITO Films Studied by In-Situ Grazing Incidence X-Ray Diffractometry", Materials Science Forum, Vols. 378-381, pp. 320-325, 2001

Online since:

October 2001

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$35.00

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