X-Ray Line Profile Analysis of Nanodisperse Silicon Nitride Ceramics

Abstract:

Article Preview

Info:

Periodical:

Materials Science Forum (Volumes 378-381)

Edited by:

R. Delhez and E.J. Mittemeijer

Pages:

729-734

DOI:

10.4028/www.scientific.net/MSF.378-381.729

Citation:

J. Gubicza et al., "X-Ray Line Profile Analysis of Nanodisperse Silicon Nitride Ceramics", Materials Science Forum, Vols. 378-381, pp. 729-734, 2001

Online since:

October 2001

Export:

Price:

$35.00

In order to see related information, you need to Login.