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HomeMaterials Science ForumMaterials Science Forum Vols. 378-381X-Ray Line Profile Analysis of Nanodisperse...

X-Ray Line Profile Analysis of Nanodisperse Silicon Nitride Ceramics

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Periodical:

Materials Science Forum (Volumes 378-381)

Pages:

729-734

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.378-381.729

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Online since:

October 2001

Authors:

Jenő Gubicza, J. Szépvölgyi, I. Mohai, Tamás Ungár

Keywords:

Grain Size Distribution, Nanodisperse Silicon Nitride, X-Ray Diffraction Profile Analysis

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© 2001 Trans Tech Publications Ltd. All Rights Reserved

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