Stacking Disorder in Aurivillius Compounds Studied by X-Ray Diffraction Line Profile Analysis

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Periodical:

Materials Science Forum (Volumes 378-381)

Edited by:

R. Delhez and E.J. Mittemeijer

Pages:

753-758

DOI:

10.4028/www.scientific.net/MSF.378-381.753

Citation:

A. Boulle et al., "Stacking Disorder in Aurivillius Compounds Studied by X-Ray Diffraction Line Profile Analysis", Materials Science Forum, Vols. 378-381, pp. 753-758, 2001

Online since:

October 2001

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$35.00

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