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HomeMaterials Science ForumMaterials Science Forum Vols. 389-393Scanning Acoustic Microscopy in Porous SiC

Scanning Acoustic Microscopy in Porous SiC

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Silicon Carbide and Related Materials 2001

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Periodical:

Materials Science Forum (Volumes 389-393)

Pages:

687-690

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.389-393.687

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Online since:

April 2002

Authors:

Sergei S. Ostapenko, M.C.D. Smith, I. Tarasov, J.T. Wolan, Marina G. Mynbaeva, J. Goings, J.C.P. McKeon, Stephen E. Saddow

Keywords:

Porous SiC, Reflection, Ultrasonic Pulses

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© 2002 Trans Tech Publications Ltd. All Rights Reserved

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