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HomeMaterials Science ForumMaterials Science Forum Vols. 389-393Optical and Electrical Characterization of...

Optical and Electrical Characterization of Free-Standing 3C-SiC Films Grown on Undulant 6in Si Substrates

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Silicon Carbide and Related Materials 2001

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Periodical:

Materials Science Forum (Volumes 389-393)

Pages:

675-678

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.389-393.675

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Online since:

April 2002

Authors:

Toshimichi Yamada, Kohei M. Itoh

Keywords:

Free Excitons, Hall-Effect Measurement, Photoluminescence (PL), Undulant Substrates

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© 2002 Trans Tech Publications Ltd. All Rights Reserved

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