Optical and Electrical Characterization of Free-Standing 3C-SiC Films Grown on Undulant 6in Si Substrates

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Periodical:

Materials Science Forum (Volumes 389-393)

Edited by:

S. Yoshida, S. Nishino, H. Harima and T. Kimoto

Pages:

675-678

DOI:

10.4028/www.scientific.net/MSF.389-393.675

Citation:

T. Yamada and K. M. Itoh, "Optical and Electrical Characterization of Free-Standing 3C-SiC Films Grown on Undulant 6in Si Substrates", Materials Science Forum, Vols. 389-393, pp. 675-678, 2002

Online since:

April 2002

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$35.00

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