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HomeMaterials Science ForumMaterials Science Forum Vols. 404-407X-Ray Diffraction Residual Stress Measurement...

X-Ray Diffraction Residual Stress Measurement Reliability: Stressed Reference Samples

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Residual Stresses VI, ECRS6

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Periodical:

Materials Science Forum (Volumes 404-407)

Pages:

573-578

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.404-407.573

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Online since:

August 2002

Authors:

C. Ferreira, Manuel François, Ronald Guillén

Keywords:

Residual Stress, Statistics, Stressed Standard Samples, X-Ray Diffraction (XRD)

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© 2002 Trans Tech Publications Ltd. All Rights Reserved

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