X-Ray Diffraction Residual Stress Measurement Reliability: Stressed Reference Samples

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Periodical:

Materials Science Forum (Volumes 404-407)

Edited by:

A.M. Dias, J. Pina, A.C. Batista and E. Diogo

Pages:

573-578

DOI:

10.4028/www.scientific.net/MSF.404-407.573

Citation:

C. Ferreira et al., "X-Ray Diffraction Residual Stress Measurement Reliability: Stressed Reference Samples", Materials Science Forum, Vols. 404-407, pp. 573-578, 2002

Online since:

August 2002

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$35.00

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