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HomeMaterials Science ForumMaterials Science Forum Vols. 404-407Measurement of Residual Stress Through a Shot...

Measurement of Residual Stress Through a Shot Peened Surface Subjected to Successive Material Removal

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Residual Stresses VI, ECRS6

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Periodical:

Materials Science Forum (Volumes 404-407)

Pages:

653-658

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.404-407.653

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Online since:

August 2002

Authors:

N.W. Bonner, Robert C. Wimpory, G.A. Webster, A. Tony Fry, F.A. Kandil

Keywords:

Electrochemical Polishing, Neutron Diffraction, Nickel-Based Superalloy, Residual Stress, Shot Peening, X-Ray Diffraction (XRD)

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© 2002 Trans Tech Publications Ltd. All Rights Reserved

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