Real Time In Situ Texture Investigations of Thin Film Growth Using RHEED

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Periodical:

Materials Science Forum (Volumes 408-412)

Edited by:

Dong Nyung Lee

Pages:

1549-1554

DOI:

10.4028/www.scientific.net/MSF.408-412.1549

Citation:

R. Hühne et al., "Real Time In Situ Texture Investigations of Thin Film Growth Using RHEED", Materials Science Forum, Vols. 408-412, pp. 1549-1554, 2002

Online since:

August 2002

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$35.00

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