AFM and SEM: Competing or Complementary Techniques?

Erika Kálmán; Péter M. Nagy; Ágnes Csanády; Katalin Papp; Hajnalka Csorbai; Cs. Hunyadi; J. Telegdi

doi:10.4028/www.scientific.net/MSF.414-415.241

Paper Titles

The Application of Digital Image Processing to Materials Science
p.213

Comparison of the Properties of Galvanised Welded Joints Produced by Different Methods
p.221

Characterization of the Microstructure of Severely Deformed Titanium by X-Ray Diffraction Profile Analysis
p.229

An Absolute Scale for the Cohesion Energy of Pure Metals
p.235

AFM and SEM: Competing or Complementary Techniques?
p.241

Investigation of Bainitic Transformation of Austempered Ductile Iron (ADI)
p.253

Correlations between Fretting Situation and the Contact Resistivity of Electrical Connections
p.261

Investigation of the Relationships between Material Properties and Processing Parameters of Boron Micro-Alloyed Quenched and Tempered Steels
p.267

Micromagnetic Measurements and their Applications
p.275

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AFM and SEM: Competing or Complementary Techniques?

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Materials Science Forum (Volumes 414-415)

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241-252

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.414-415.241

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Online since:

January 2003

Authors:

Erika Kálmán, Péter M. Nagy, Ágnes Csanády, Katalin Papp, Hajnalka Csorbai, Cs. Hunyadi, J. Telegdi

Keywords:

Atomic Force Microscope (AFM), Environmental Electron Microscope, Scanning Electron Microscope (SEM), SPM

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