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HomeMaterials Science ForumMaterials Science Forum Vols. 426-432The Effect of Grain Growth Suppression on the...

The Effect of Grain Growth Suppression on the Interface Population in Nimonic PE16

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THERMEC'2003

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Periodical:

Materials Science Forum (Volumes 426-432)

Pages:

3557-3562

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.426-432.3557

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Online since:

August 2003

Authors:

Valerie Randle

Keywords:

Twinning, Electron Backscatter Diffraction (EBSD), Grain Boundary Migration, Grain Boundary Pinning, Orientation Mapping

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© 2003 Trans Tech Publications Ltd. All Rights Reserved

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