Sensitivity of Positron Annihilation Spectroscopy to Energy Contamination in Low Energy Boron Ion Implantation

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Periodical:

Materials Science Forum (Volumes 445-446)

Edited by:

Toshio Hyodo, Yoshinori Kobayashi, Yasuyuki Nagashima, Haruo Saito

Pages:

123-125

DOI:

10.4028/www.scientific.net/MSF.445-446.123

Citation:

A.P. Knights and P. G. Coleman, "Sensitivity of Positron Annihilation Spectroscopy to Energy Contamination in Low Energy Boron Ion Implantation", Materials Science Forum, Vols. 445-446, pp. 123-125, 2004

Online since:

January 2004

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