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Native Defects in n-type Sn-Doped GaAs Using Positron Annihilation Technique
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Investigation of Defects in Copper Alloys Selected for Nuclear Fusion Technology
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HomeMaterials Science ForumMaterials Science Forum Vols. 445-446Positron Trapping within the Grain and at Grain...

Positron Trapping within the Grain and at Grain Boundaries in Sintered Alumina of High Impurity Content

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Periodical:

Materials Science Forum (Volumes 445-446)

Pages:

177-179

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.445-446.177

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Online since:

January 2004

Authors:

A. Si Ahmed, Jerzy Kansy, Kamel Zarbout, Gérard Moya, Dominique Gœuriot

Keywords:

Bulk Defects, Grain Boundary Defects, Positron Trapping, Sintered Alumina

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© 2004 Trans Tech Publications Ltd. All Rights Reserved

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