Nanocrystalline Si Studied by Beam-Based Positron Annihilation Spectroscopy

Abstract:

Article Preview

Info:

Periodical:

Materials Science Forum (Volumes 445-446)

Edited by:

Toshio Hyodo, Yoshinori Kobayashi, Yasuyuki Nagashima, Haruo Saito

Pages:

66-68

Citation:

P. G. Coleman et al., "Nanocrystalline Si Studied by Beam-Based Positron Annihilation Spectroscopy", Materials Science Forum, Vols. 445-446, pp. 66-68, 2004

Online since:

January 2004

Export:

Price:

$38.00

[1] T. Shimizu-Iwayama et al., J. Phys: Condens. Matter 5 (1993) L375.

[2] L. Pavesi, L. D. Negro, C. Mazzoleni, G. Franzo, F. Priolo, Nature 408 (2000) 440.

DOI: https://doi.org/10.1038/35044012

[3] J. P. Proot, C. Delerue, G. Allan, Appl. Phys. Lett. 61 (1992) (1948).

[4] M. V. Wolkin, J. Jorne, P. M. Fauchet, G. Allan, C. Delerue, Phys. Rev. Lett. 82 (1999) 197.

[5] P. Asoka-Kumar, K. G. Lynn, D. 0. Welch, J. Appl. Phys. 76 (1994) 4935.

[6] R.S. Brusa et al., Appl. Surf. Sci. 194 (2002) 106.

[7] R. Krause-Rehberg, H.S. Leipner, Positron Annihilation in Semiconductors, Springer, (1999).

DOI: https://doi.org/10.1007/978-3-662-03893-2_3

[8] H. L. Au, P. Asoka-Kumar, B. Nielsen, K. G. Lynn, J. Appl. Phys. 73 (1993) 2972.

[9] R. Khatri, P. AsokaKumar, B. Nielsen, L.O. Roellig, K.G. Lynn, Appl. Phys. Lett. 65 (1994) 330.

[10] P. G. Coleman, N. B. Chilton, J. A. Baker, J. Phys. Condens. Matter 2 (1990) 9355.

[11] M. Fujinami, Phys. Rev. B 53 (1996) 13047.

[12] A. Uedono et al., Jpn. J. Appl. Phys. Pt. 1 36 (1997) 2571.

[13] X. D. Pi, C. P. Burrows, P. G. Coleman, Phys. Rev. Lett. 90 (2003) 155901.

[14] N. B. Chilton, P. G. Coleman, Meas. Sci. Technol. 6 (1995) 53.

[15] A. G. Revesz, J. Electrochem. Soc. 126 (1979) 122.

[16] G. Brauer, G. Boden, Diffusion and Defect Data 53-54 (1987) 173.

[17] Q. Zhang, S. C. Bayliss, D. A. Hutt, Appl. Phys. Lett. 66 (1995) (1977).

[18] G. Ghislotti, B. Nielsen, P. Asoka-Kumar, K. G. Lynn, L. F. D. Mauro, F. Corni, R. Tonini, Appl. Phys. Lett. 70 (1997) 496.

[19] A.P. Knights, P.J. Simpson, L.B. Allard, J.L. Brebner, J. Albert, J. Appl. Phys. 79 (1996) 9022.

[20] G. Ledoux, 0. Guillois, D. Porterat, C. Reynaud, F. Huisken, B. Kohn, V. Paillard, Phys. Rev. B 62 (2000) 15942.

DOI: https://doi.org/10.1103/physrevb.62.15942

Fetching data from Crossref.
This may take some time to load.