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Materials Science Forum Vols. 445-446

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.445-446

ToC:

Table of Contents

Paper Title Page

Reliability Test of a PAL Spectrometer - Selected Results on Fe
Authors: S. May-Tal Beck, Gerhard Brauer, W. Anwand, Z. Berant, O. Shahal, M. Ganor, I. Israelashwily
495
Non-Destructive Lifetime Prediction in Material Testing with the Bonn Positron Microprobe
Authors: I. Müller, K. Bennewitz, M. Haaks, T.E.M. Staab, S. Eisenberg, T. Lampe, Karin Maier
498
Design and Implementation of a S-Parameter Wafer Defect Scanner
Authors: P.S. Naik, C.D. Beling, S. Fung
501
HV Design of a Pulsed Lifetime Beam with a Grounded Sample
Authors: Antti Pelli, Antti Laakso, Klaus Rytsölä, Reino Aavikko, Mikko Rummukainen, Kimmo Saarinen
504
Long Term Performance of the Reactor Based Positron Beam POSH
Authors: H. Schut, A. van Veen, J. de Roode, F. Labohm
507
Spatially Resolved Detection of Point Defects in the Vicinity of Scratches on GaAs by the Bonn Positron Microprobe
Authors: T.E.M. Staab, C. Zamponi, M. Haaks, I. Müller, S. Eichler, Karin Maier
510
The Slow Positron Beam Based on Beijing Electron-Positron Collider
Authors: Bao Yi Wang, Xing Zhong Cao, Run Sheng Yu, Cun Feng Wei, Zhi Ming Zhang, Chuang Xin Ma, Tian Bao Chang, Guo Xi Pei, Jia Cai Li, Lin Sheng Zheng, Long Wei, Tian Min Wang, Yuan-Jin He, Wei Zhong Yu, Sheng Yun Zhu
513
A High-Resolution BaF2 Positron Lifetime Spectrometer with High Counting Rate
Authors: Long Wei, Zhi Ming Zhang, Chuang Xin Ma, Chun Lan Zhou, Bao Yi Wang, Tian Bao Chang, Shao Xia Ren
516
Condensed Matter and Defect-Related Research at ICPA-13
Authors: A. van Veen
519
ICPA-13 Summary Talk: Chemistry and Polymers
Authors: Z. Kajcsos
523

Showing 151 to 160 of 161 Paper Titles

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