XPS Analysis and Atomic Force Microscopy Observation of Micro-Liquids Adsorbed on Pure Iron and Copper Surfaces

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Abstract:

The adsorptive on pure iron and copper surfaces was investigated with angle resolved X-ray photoelectron spectroscopy (ARXPS) and atomic force microscope (AFM). Organic species and a little amount of water (micro-droplets surrounded with nanometer-scale film-like-domains) were detected on the oxidized and/or hydrated metallic surfaces for both specimens and their minute structures were discussed.

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Materials Science Forum (Volumes 449-452)

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1025-1028

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March 2004

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© 2004 Trans Tech Publications Ltd. All Rights Reserved

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