XPS Analysis and Atomic Force Microscopy Observation of Micro-Liquids Adsorbed on Pure Iron and Copper Surfaces

Abstract:

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The adsorptive on pure iron and copper surfaces was investigated with angle resolved X-ray photoelectron spectroscopy (ARXPS) and atomic force microscope (AFM). Organic species and a little amount of water (micro-droplets surrounded with nanometer-scale film-like-domains) were detected on the oxidized and/or hydrated metallic surfaces for both specimens and their minute structures were discussed.

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Periodical:

Materials Science Forum (Volumes 449-452)

Edited by:

S.-G. Kang and T. Kobayashi

Pages:

1025-1028

Citation:

R. G. Wang et al., "XPS Analysis and Atomic Force Microscopy Observation of Micro-Liquids Adsorbed on Pure Iron and Copper Surfaces", Materials Science Forum, Vols. 449-452, pp. 1025-1028, 2004

Online since:

March 2004

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$38.00

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