XPS Analysis and Atomic Force Microscopy Observation of Micro-Liquids Adsorbed on Pure Iron and Copper Surfaces

Abstract:

Article Preview

The adsorptive on pure iron and copper surfaces was investigated with angle resolved X-ray photoelectron spectroscopy (ARXPS) and atomic force microscope (AFM). Organic species and a little amount of water (micro-droplets surrounded with nanometer-scale film-like-domains) were detected on the oxidized and/or hydrated metallic surfaces for both specimens and their minute structures were discussed.

Info:

Periodical:

Materials Science Forum (Volumes 449-452)

Edited by:

S.-G. Kang and T. Kobayashi

Pages:

1025-1028

DOI:

10.4028/www.scientific.net/MSF.449-452.1025

Citation:

R. G. Wang et al., "XPS Analysis and Atomic Force Microscopy Observation of Micro-Liquids Adsorbed on Pure Iron and Copper Surfaces", Materials Science Forum, Vols. 449-452, pp. 1025-1028, 2004

Online since:

March 2004

Export:

Price:

$35.00

In order to see related information, you need to Login.

In order to see related information, you need to Login.