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Paper Titles
Preface
Two-Dimensional X-Ray Diffraction for Structure and Stress Analysis
p.1
Diffraction Stress Analysis Using Direction Dependent Grain-Interaction Models
p.7
Mechanics of End Effects in Thin Film and Substrate Stress Distributions
p.13
Application of X-Ray and Neutron Diffraction Methods to Reliability Evaluation of Structural Components and Electronic Device
p.19
Multiscale Study of Internal Stress and Texture in Ferroelectrics
p.28
FaME38 - Improving the Effectiveness of Strain Measurements
p.29
Evaluation of Local Stress Distribution Near Notch and Crack Tips in Al2O3 by Synchrotron Radiation
p.35
Residual Stresses around an Expanded Hole in an Aluminum Clad Sheet
p.41
HomeMaterials Science ForumMaterials Science Forum Vols. 490-491Preface

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Materials Science Forum (Volumes 490-491)

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July 2005

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© 2005 Trans Tech Publications Ltd. All Rights Reserved

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