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HomeMaterials Science ForumMaterials Science Forum Vols. 495-497Application of Orientation Microscopy in SEM and...

Application of Orientation Microscopy in SEM and TEM for the Study of Texture Formation during Recrystallisation Processes

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Abstract:

Orientation microscopy in TEM and SEM is a particularly well suited tool to study recrystallisation processes because these are always associated with orientation and microstructure changes. The present work discusses the possibilities and limits of the TEM and SEM based techniques and illustrates their use by means of 3 different examples. The examples include studies on nucleation mechanisms of primary recrystallisation where the techniques meet their limits in spatial resolution. The problem of in-situ observations of annealing processes is discussed and it is shown how recrystallisation simulation techniques based on experimental data may be used. Furthermore the new technique of 3-dimensional EBSD in a focused-ion-beam (FIB) SEM is presented with one example. Finally, the statistical analysis of very large orientation data sets is discussed by an example of secondary recrystallisation in electrical steels.

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Textures of Materials - ICOTOM 14

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Periodical:

Materials Science Forum (Volumes 495-497)

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3-12

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.495-497.3

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Online since:

September 2005

Authors:

Stefan Zaefferer

Keywords:

3D-EBSD, Abnormal Grain Growth, Electron Backscatter Diffraction (EBSD), FIB, Nucleation Mechanism, Shear Band, TEM Diffraction Pattern

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© 2005 Trans Tech Publications Ltd. All Rights Reserved

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[1] B. J. Duggan, K. Lücke, G. Köhlhoff, C.S. Lee, Acta metall. mater., 41 (1993), (1921).

[2] H.F. Poulsen, X. Fu, E. Knudsen, E.M. Lauridsen, L. Margulies, S. Schmidt, Proc. 2 nd Joint Int. Conf. Recrystallization and Grain Growth, ReX& GG2, Material Science Forum 467 - 470, (2004), 1363-1372.

DOI: 10.4028/www.scientific.net/msf.467-470.1363

[3] D.J. Dingley, Journal of Microscopy 213 (2004), 214-224.

[4] A.J. Schwartz, M. Kumar, B.L. Adams (eds. ), Electron Backscatter Diffraction in Material Science. Kluwer Acad. /Plenum Publ., New York (2000).

[5] N.C. Krieger Lassen, D. Juul Jensen, K. Conradsen, Scanning Microscopy 6 (1992), 115-121.

[6] R.A. Schwarzer, Micron, 28 (1997), 249-265.

[7] B.L. Adams, S.I. Wright, K. Kunze, Metall. Trans. 24A (1993), 819-831.

[8] M. Groeber, B. Haley, M. Uchic, S. Ghosh, AIP Conference Proceedings 712 (2004) 1712.

[9] S. Zaefferer, Adv. Eng. Mat. 5 (2003), 745 -752.

[10] J. J. Fundenberger, A. Morawiec, E. Bouzy, J. S. Lecomte, Ultramicroscopy 96 (2003), 127.

DOI: 10.1016/s0304-3991(02)00435-7

[11] N.C. Krieger-Lassen, Proc. 16th Risø Intern. Symp. (1995), 405-411.

[12] R.A. Schwarzer, J. Sukkau, Mater. Sci. Forum 273-275 (1998), 215-222.

[13] S. Zaefferer, Journal of Applied Crystallography 33 (2000), 10 - 25.

[14] S. Zaefferer, Advances in Imaging and Electron Physics 125 (2002), 355 - 415.

[15] S.I. Wright, D.J. Dingley, Mater. Sci. Forum, 273-275 (1998), 209.

[16] A.A. Ridha, W.B. Hutchinson, Acta metall. 30 (1982), (1929).

[17] H. Réglé, Proc. 1 st Joint Int. Conf. Recrystallization and Grain Growth, ReX& GG1, Springer Verlag Berlin, (2004), 707-717.

[18] S. Zaefferer, T. Baudin, R. Penelle, Acta mater. 49 (2001), 1105 - 1122.

[19] F.J. Humphreys, Acta Materialia 45 (1997) 5031.

[20] D.M. Saylor, A. Morawiec, G.S. Rohrer, Acta Materialia 51 (2003), 3675.

[21] S. Suzuki, Y. Ushigami, H. Homma, S. Takebayashi, T. Kubota, Mater. Trans. 42 (2001), 994.

[22] S. Zaefferer, Le Revue de Métallurgie (2003), 891 - 901.

[23] F.J. Humphreys, J . Mat. Sci. 36 (2001), 3833-3854.

[24] S. Zaefferer, JEOL News 39 (2004), 10 - 15.

[25] F.J. Humphreys, P.S. Bate, P.J. Hurley, Journal of Microscopy 201 (2001), 50.

[26] M.M. Nowell, D.P. Field, S.I. Wright, T.M. Lillo, Proc. 2nd Joint Int. Conf. Recrystallization and Grain Growth, ReX& GG2, Material Science Forum 467 - 470 (2004), 1401 - 1406.

DOI: 10.4028/www.scientific.net/msf.467-470.1401

[27] G.G.E. Seward, D.J. Prior, J. Wheeler, S. Celotto, D.J.M. Halliday, R.S. Paden, M.R. Tye, Scanning 24 (2004), 232-240.

DOI: 10.1002/sca.4950240503

[28] R. Penelle, T. Baudin, D.J. Dingley, M. Tiner, S.I. Wright, Proc. 13 th Intern. Conf. Textures of Materials (ICOTOM 13) (2002), 523-529.

[29] W.B. Hutchinson, Acta metall. 37 (1989), 1047.

[30] I. Thomas, S. Zaefferer, F. Friedel, D. Raabe, Adv. Eng. Mat. 5 (2003), 566 - 570.

[31] N. Chen, S. Zaefferer, L. Lahn, K. Günther, D. Raabe, Proc. of the 13 th Int. Conf. Textures of Materials (ICOTOM 13) Seoul (2002), 949 - 954.

[32] E.A. Holm, M.A. Miodownik, K.J. Healey, Proc. 2 nd Joint Int. Conf. Recrystallization and Grain Growth, ReX& GG2, Material Science Forum 467 - 470 (2004), 611-616.

DOI: 10.4028/www.scientific.net/msf.467-470.611

[33] M. Demura, Y. Suga, O. Umezawa, K. Kishida, E.P. George, T. Hirano, Intermetallics 9 (2001), 157-167.

DOI: 10.1016/s0966-9795(00)00121-7

[34] N. Chen, S. Zaefferer, L. Lahn, K. Günther, D. Raabe, Acta mater. 51 (2003), 1755 - 1765.

[35] J. Von Neumann, Metal interfaces. American Society for Metals, Cleveland 1952, 108.

[36] H. Homma, B. Hutchinson, Acta mater. 51, 3795-3805 (2003).

[37] S. Zaefferer, N. Chen, Int. Conf. Textures and Anisotropy of Polycrystals (ITAP2)(2004), in press.

[38] D. Dorner, L. Lahn, S. Zaefferer, Proc. 2 nd Joint Int. Conf. Recrystallization and Grain Growth, ReX& GG2, Material Science Forum 467 - 470, (2004), 129 - 134.