EB Induced Stress Relaxation of Tight Network Structure in Silica and Soda Glasses

Abstract:

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This paper mainly describes that nano-scale surface structure change in dangling bond density related to free volume caused the reinforcement of inorganic glass irradiated by electron beam. Based on the results of electron spin resonance experiments, EB irradiation enhanced the density of dangling bonds at the glass surface. To confirm the strengthening principle, we have employed EB irradiation of inorganic glass. The EB reinforcement was explained as caused by stress relaxation induced by dangling bonds formation in the tight network structure of silica and soda glasses.

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Periodical:

Edited by:

Masaaki Naka and Toshimi Yamane

Pages:

385-392

DOI:

10.4028/www.scientific.net/MSF.502.385

Citation:

Y. Nishi et al., "EB Induced Stress Relaxation of Tight Network Structure in Silica and Soda Glasses ", Materials Science Forum, Vol. 502, pp. 385-392, 2005

Online since:

December 2005

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$35.00

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