Anomalous Broad Dielectric Dispersion of 0.4PZN-0.3PSN-0.3PZN Relaxor Ceramics at Lower Temperatures

Juras Banys; Jan Macutkevic; Algirdas Brilingas; Vytautas Samulionis; K. Bormanis; Andris Sternberg; Vismantas Zauls

doi:10.4028/www.scientific.net/MSF.514-516.216

Paper Titles

Design and Analysis of the PZT-Based Piezoelectric Transformer
p.198

Separation of the Pyro- and Piezoelectric Response of Electroactive Polymers for Sensor Applications
p.202

Structural Characterization of Lead Metaniobate Thin Films Deposited by Pulsed Laser Ablation
p.207

Ferroelectric and Dielectric Characteristics of Bi_3.25La_0.75Ti₃O₁₂ Thin Films Prepared by the Polymeric Precursor Method
p.212

Anomalous Broad Dielectric Dispersion of 0.4PZN-0.3PSN-0.3PZN Relaxor Ceramics at Lower Temperatures
p.216

Development of an Ultrasonic Motor Based on a Piezoelectric Ceramic Sandwiched between Two Laminate Composite Plates
p.221

Piezoelectric Material for High Efficiency Ultrasonic Siren
p.225

The Characterization of Two Dimensional Electrostrictive CuInP₂S₆ Materials for Transducers
p.230

Dielectric Investigations and Theoretical Calculations of Size Effect in Lead Titanate Nanocrystals
p.235

HomeMaterials Science ForumMaterials Science Forum Vols. 514-516Anomalous Broad Dielectric Dispersion of...

Anomalous Broad Dielectric Dispersion of 0.4PZN-0.3PSN-0.3PZN Relaxor Ceramics at Lower Temperatures

Abstract:

Dielectric properties of 0.4PbZn1/3Nb2/3O3-0.3PbSc1/2Nb1/2O3-0.3PbMg1/3Nb2/3O3- (0.4PZN- 0.3PSN-0.3PMN) ceramics are presented for 200 < T < 500 K and 20 Hz < ν < 1 MHz. Dielectric constant is very high (more 14000) in the vicinity of the peak. Anomalous broad dielectric relaxation have been observed near the temperature of the maximum permittivity, Tm (at 1 kHz). External bias field considerably lowers the value of dielectric losses at low frequencies due to decrease of polar nano regions contribution to the dielectric permittivity.

You might also be interested in these eBooks

View Preview

Info:

Periodical:

Materials Science Forum (Volumes 514-516)

Pages:

216-220

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.514-516.216

Citation:

Cite this paper

Online since:

May 2006

Authors:

Juras Banys, Jan Macutkevic, Algirdas Brilingas, Vytautas Samulionis, K. Bormanis, Andris Sternberg, Vismantas Zauls

Keywords:

Dielectric Spectroscopy, Distribution of Relaxation Times, Relaxor

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

Citation:

References

[1] C. Malibert, et al: J. Phys.: Condens. Matter. Vol. 9 (1997), p.7485.

Google Scholar

[2] Z. Y. Cheng, et al Phys.: Rev. B Vol. 55 (13) (1997), p.8165.

Google Scholar

[3] C. Perrin, et al J. Phys.: Condens. Matter. Vol. 12 (2000), p.7523.

Google Scholar

[4] D. La-Orautapong, J. Toulouse, J. L. Robertson, and Z. G. Ye: Phys. Rev. B Vol. 64 (2001), 212101.

Google Scholar

[5] N. de Mathan, et al: J. Phys.: Condens. Matter. Vol. 3 (1991): p.8159.

Google Scholar

[6] R. Pirc and R. Blinc: Phys. Rev. B Vol. 60 (19) (1999), p.13470.

Google Scholar

[7] P. Raevski et al. : Integrated Ferroelectrics Vol. 53 (2003), p.475.

Google Scholar

[8] Dambekalne, K. Bormanis, A. Stenberg and I. Brandte: Ferroelectrics Vol. 240 (2000), p.221.

Google Scholar

[9] S. Kamba, V. Bovtun, J. Petzelt, I. Rychetsky, R. Mizaras, A. Brilingas, J. Banys, J. Grigas, and M. Kosec: J. Phys. Cond. Matter Vol. 12, (2000).

DOI: 10.1088/0953-8984/12/4/309

Google Scholar