Nano-Order Structural Analysis of White Light-Emitting Silicon Oxide Prepared by Successive Thermal Carbonization/Oxidation of the Porous Silicon

Shunsuke Muto; A.V. Vasin; Yukari Ishikawa; Noriyoshi Shibata; Jarno Salonen; Vesa Pekka Lehto

doi:10.4028/www.scientific.net/MSF.561-565.1127

Paper Titles

Onset Magnetic Field for Rearrangement of Martensite Variants in Ni₂MnGa
p.1109

Thermal Behavior of Electron Irradiation Defects in CZ-Si
p.1113

Large Linear and Volume Magnetostriction in Fe-Ga Alloys
p.1117

Improvement of Magnetic Characteristic in Spheroidal Graphite Cast Iron
p.1123

Nano-Order Structural Analysis of White Light-Emitting Silicon Oxide Prepared by Successive Thermal Carbonization/Oxidation of the Porous Silicon
p.1127

Microstructure of Anisotropic Nd-Fe-B Film Magnets Prepared by Pulsed Laser Deposition
p.1131

An Actuator Laser of Optical Disk Drive High-Frequency Electromagnetic Vibrations Characteristic Analysis
p.1135

Structural, Electrical and Magnetic Properties of Ni₃₃Fe₆₇ and Ni₂₁Fe₇₉ Films Deposited on SiO₂/Si(100) at 633 K by DC Magnetron Co-Sputtering
p.1141

Deposition of a Well-Adherent Nano-Crystalline Diamond Coating on Titanium Using CH₄-H₂ Gas Mixture
p.1145

HomeMaterials Science ForumMaterials Science Forum Vols. 561-565Nano-Order Structural Analysis of White...

Nano-Order Structural Analysis of White Light-Emitting Silicon Oxide Prepared by Successive Thermal Carbonization/Oxidation of the Porous Silicon

Abstract:

Recently the present authors’ group found that porous silicon showed strong and stable white/white-blue light emission after successive thermal carbonization and oxidation by water vapor. This material can be considered as a price-competitive solid-state white-light source. We examined these layers by electron energy-loss spectroscopy (EELS), energy-filtering transmission electron microscopy (EFTEM). The EEL spectra indicated that the silicon skeleton in the porous layer was completely oxidized by the thermal treatment in wet argon ambient and multi-types of carbon phases were present in the 1073 K oxidized sample of stronger emission, while carbon complexes including Si and/or O were formed in the 1223 K oxidized sample of weaker light emission. EF-TEM images showed that carbon/oxygen were more uniformly distributed in the 1223 K oxidized sample. It is assumed that the strong light-emitting properties are controlled by the size and internal chemical bonding states of carbon clusters incorporated.