X-Ray Diffraction Analysis of Oxide Layers of Zr-Based Alloys

Galina Gosmanová; Ivo Kraus; Michal Kolega; Věra Vrtílková

doi:10.4028/www.scientific.net/MSF.567-568.237

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HomeMaterials Science ForumMaterials Science Forum Vols. 567-568X-Ray Diffraction Analysis of Oxide Layers of...

X-Ray Diffraction Analysis of Oxide Layers of Zr-Based Alloys

Abstract:

The results of X-ray diffraction analysis of macroscopic stresses σ and crystallite size D in oxide layers are presented in this contribution. The oxide layers were formed on tubular specimens of Zircaloy 4 and Zr1Nb alloys which were simultaneously oxidized for various times under temperature transient conditions (oxidation in water at 360 °C with a short-time shock in steam at 500 °C). A qualitative relation was outlined between the residual stresses in oxide layers and corrosion kinetics of the alloys under investigation.

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Periodical:

Materials Science Forum (Volumes 567-568)

Pages:

237-240

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.567-568.237

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Online since:

December 2007

Authors:

Galina Gosmanová, Ivo Kraus, Michal Kolega, Věra Vrtílková

Keywords:

Oxide Layer, Residual Stress, X-Ray Diffraction (XRD), Zirconium Alloys

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References

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DOI: 10.1107/s0021889883010493

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0 100 200 300 400 Exposure (days) G (MPa / µµµµ m) Zr1Nb Zry -4 S B.

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[2] [4] [6] [8] [10] [12] 0 100 200 300 400 Exposure (days) Oxide thickness (µµµµ m) Zr1Nb Zry -4 S A Zry-4 S.

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[2] [4] [6] [8] [10] [12] 0 200 400 Exposure (days) Oxide thickness (µµµµ m) pure water wat-steam-wat steam-water Zry-4 S -900 -700 -500 -300 -100 0 200 400 Exposure (days) Gt (MPa/µµµµ m) pure water wat-steam-wat steam-water Zr1Nb.

DOI: 10.2118/27794-ms

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[2] [4] [6] [8] [10] 0 200 400 Exposure (days) Oxide thickness (µµµµ m) pure water wat-steam-wat steam-water Zr1Nb -900 -700 -500 -300 -100 0 200 400 Exposure (days) Gt (MPa/µµµµ m) pure water wat-steam-wat steam-water A A B B.

DOI: 10.2118/27794-ms

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