Application of Synchrotron Radiation to Residual Stress Analysis by IP/cosα Method

Toshihiko Sasaki; Yohei Miyazawa; Shunichi Takahashi; Ryohei Matsuyama; Katsunari Sasaki; Koichi Hiratsuka

doi:10.4028/www.scientific.net/MSF.571-572.249

Paper Titles

Measurement of all Six Components of X-Ray Elastic Factors
p.225

Use of Stored Energy Distribution in Stochastic Vertex Model
p.231

Imaging Diffraction Using Maxim at G3/Hasylab - Spatial Resolved Strain Measurements on Linear Friction Welded Dissimilar Materials (AA7020-T6/Ti6AlV
p.237

Two-Dimensional Mapping of Crack-Face Bridging Stresses in Alumina Using Synchrotron Micro X-Ray Beam
p.243

Application of Synchrotron Radiation to Residual Stress Analysis by IP/cosα Method
p.249

Influence of Peak Determination Method on Area Detector Type Neutron Stress Measurement
p.255

The High Energy Materials Science Beamline at PETRA III
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Measurement of Internal Strain in Materials Using High Energy White X-Ray at SPring-8
p.267

Inter-Granular Residual Stresses in Polycrystalline Aggregates: Finite Element Modelling and Diffraction Post-Processing
p.271

HomeMaterials Science ForumMaterials Science Forum Vols. 571-572Application of Synchrotron Radiation to Residual...

Application of Synchrotron Radiation to Residual Stress Analysis by IP/cosα Method

Abstract:

The X-ray stress measurement with synchrotron radiation (SR) and an image plate (IP) was conducted using the facility of the Photon Factory (PF) of the High Energy Accelerator Research Organization (KEK). The influence of 2θ on stress measurement with the cosα method was investigated. The experiments were conducted under the conditions of 2θ=170 deg, 156.4 deg and 127 deg respectively. It was found that the hypothesis on the relation between the accuracy and the diffraction angle in the X-ray method is not valid in case of the cosα method.