Application of Synchrotron Radiation to Residual Stress Analysis by IP/cosα Method

Abstract:

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The X-ray stress measurement with synchrotron radiation (SR) and an image plate (IP) was conducted using the facility of the Photon Factory (PF) of the High Energy Accelerator Research Organization (KEK). The influence of 2θ on stress measurement with the cosα method was investigated. The experiments were conducted under the conditions of 2θ=170 deg, 156.4 deg and 127 deg respectively. It was found that the hypothesis on the relation between the accuracy and the diffraction angle in the X-ray method is not valid in case of the cosα method.

Info:

Periodical:

Materials Science Forum (Volumes 571-572)

Edited by:

A. R. Pyzalla, A. Borbély and H.-P. Degischer

Pages:

249-254

DOI:

10.4028/www.scientific.net/MSF.571-572.249

Citation:

T. Sasaki et al., "Application of Synchrotron Radiation to Residual Stress Analysis by IP/cosα Method", Materials Science Forum, Vols. 571-572, pp. 249-254, 2008

Online since:

March 2008

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Price:

$35.00

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